In-situ bonding strength measurement of the β-Ga2O3/diamond heterostructure. (IMAGE)
Caption
(A) TEM image of the focused ion beam (FIB)-fabricated β-Ga2O3/diamond sample for the tensile test. (B) Relationship between the applied stress and indenter displacement. (C) Comparison of the fracture strength of distinct diamond (and Ga2O3)-based heterostructures. (D) Side view models and (E) the corresponding calculated Work of adhesion (Wad).
Credit
©Science China Press
Usage Restrictions
Use with credit.
License
Original content