Defect Annihilation (IMAGE)

DOE/Argonne National Laboratory

Defect Annihilation

Caption

Using the supercomputing resources at the Argonne Leadership Computing Facility, University of Chicago and Argonne researchers have found a way miniaturize microchip components using a technique producing zero defects. This advance will allow semiconductor manufacturers to meet miniaturization target dates to produce smaller components with added functionality for our favorite devices.

Credit

de Pablo et al.

Usage Restrictions

None

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.