Figure 3 Thickness demodulation workflow for atomic layer materials and geometric thickness profiling results of a graphene terrace. (IMAGE)

Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS

Figure 3 Thickness demodulation workflow for atomic layer materials and geometric thickness profiling results of a graphene terrace.

Caption

Figure 3 Thickness demodulation workflow for atomic layer materials and geometric thickness profiling results of a graphene terrace. a, Recording of hologram sequences followed by angular interrogation and identification of the resonance angle at the minimum reflectivity. b, The thickness demodulation curve. The inset shows a five-layer SPR excitation configuration and bright-field microscope image of a graphene terrace on the Au substrate. The thickness is finally determined via Gaussian fitting. c, Geometric thickness profiling results of a graphene terrace obtained from AFM and SPR holographic microscope.

Credit

Jiwei Zhang et al.

Usage Restrictions

Credit must be given to the creator.

License

CC BY

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.