Figure 2 (IMAGE)

Tohoku University

Figure 2

Caption

TEM images of graphene oxide in the fault gouge (excerpt). (Left) TEM image of a foil sample cut across a microcrack within the fault gouge (the darker region on the left consists of quartz and clay minerals, while the right side shows carbonaceous material filling the crack, including graphene oxide). The inset shows a Selected Area Electron Diffraction (SAED) pattern collected from location 7 in the TEM image. (Right) High-resolution TEM (HRTEM) image showing graphene oxide nanoparticles. The insets show fast Fourier transform (FFT) patterns from regions I, II, and III. The yellow dashed regions contain distinct lattice fringes with a spacing of d = 0.21 nm, corresponding to the (100) plane of graphene.

Credit

Tomoya Shimada et al

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