Figure 2 | Experimental validation of wide-range maximum chirality of the chiral k-domain metasurface. (IMAGE)
Caption
Figure 2 | Experimental validation of wide-range maximum chirality of the chiral k-domain metasurface. a, Top-view scanning electron microscope (SEM) image of the fabricated planar chiral metasurface (left; scale bar: 500 nm) and a schematic illustrating the unit cell under a tilted wavevector k, dependent on incidence angle θ and azimuth angle φ (right). b, Schematic of the home-built reflective spectroscopy setup that is used to measure the circular-polarization-based Jones matrix. c, Measured reflection Jones matrix under LCP/RCP incidence for a sample with R = 70 nm, dx = 24 nm, and dy = 240 nm. The solid red curve is the Fano fit of the RLL component. d-f, Measured reflectance spectra of RLL with incidence angle θ = 0° to 5° in 1° increments for φ = 0°, 60°, and 90°, respectively. g,h, Extracted Q-factor and CD values from the reflectance spectra as a function of θ at various φ.
Credit
Jinhui Shi et al.
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