FIG. 3. Test of the universal materials model by comparing DFT-calculated and DeepH-predicted properties (IMAGE)

Science China Press

FIG. 3. Test of the universal materials model by comparing DFT-calculated and DeepH-predicted properties

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Testing the universal materials model by comparing DFT-calculated and DeepH-predicted band structures and electric susceptibilities χ  as a function of frequency ω  for representative test materials (with MAE ranks of ~20%, ~40% ~60% and ~80%). The corresponding material structures are displayed in the insets.

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