Schematic of the Electric-Field Distribution in an STM Junction under Field-Emission Conditions (IMAGE)
Caption
When a large bias voltage is applied to the metallic tip of a scanning tunneling microscope, electrons are emitted from the tip apex and travel toward the sample. The electric field within the tunneling junction comprises the tip-induced field and the transient field generated by the field-emitted electron. The radial component of the tip-induced field, Er, is inversely proportional to the dielectric constant of the substrate and the tip–sample distance.
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