Characterization of CoS2/NiS2@HCNFs Composite: Structure, Loss Mechanism, and Microwave Absorption Performance (IMAGE)
Caption
This figure presents a multidimensional overview of the core information for the CoS2/NiS2@HCNFs composite. The top-left corner illustrates a schematic of the material structure (CoS2/NiS2 nanoparticles anchored on the surface of hollow carbon nanofibers) and the distribution of the strong built-in electric field (BIEF) at the heterointerface. The top-right corner shows a scanning electron microscopy (SEM) image of the CNSF-1 sample, displaying its hierarchical nanoflower-like morphology. The central section clarifies two primary loss mechanisms: conduction loss, and multiple reflection and scattering of electromagnetic waves. The bottom-left area presents the crystal structures of NiS2 and CoS2 along with dipole polarization induced by sulfur vacancies; the bottom-right illustrates the defect structure of the carbon matrix. In the middle-right section, the Mott-Schottky test curve of the material reflects its semiconductor properties. The lower-right section features a 3D plot of the reflection loss for the CNSF-1 sample at a thickness of 2.4 mm, visually demonstrating its excellent absorption performance with RLmin as low as -48.04 dB. The overall layout employs a white background with integrated graphical and textual elements.
Credit
Nano Research, Tsinghua University Press
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