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(a) High-resolution SEM image and (b) confocal optical image of the graphene‒AlN substrate superimposed with the SEM image. (c) Optical image of characteristic areas (consistent with those in panel (a) indicated by green arrows). Raman mapping images of (d) the G peak of the graphene film and (e)(f) A1(TO) and E2(high) peaks of the AlN substrate, revealing the difference in Raman signal distributions among different crystal planes.
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HIGHER EDUCATON PRESS
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