Figure 1: Near-field SHG experiments in the angstrom-scale plasmonic junction of STM. (IMAGE)

National Institutes of Natural Sciences

Figure 1: Near-field SHG experiments in the angstrom-scale plasmonic junction of STM.

Caption

a Energy level diagram of SHG process. b Scanning electron micrograph of the Au tip used in the experiments. c Schematic depiction of near-field SHG experiment. A Au tip and a Au substrate were mounted on an STM unit and formed an angstrom-scale gap with an applied bias voltage V. The gap region was irradiated by femtosecond near-IR laser with a frequency of ω, and near-field SHG with a frequency of 2ω was detected in both forward- and backward-scattering geometries.

Credit

Adapted from Takahashi et al. (2026), Nature Communications

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