Low dielectric loss in vanadium-based zircon ceramics via high-entropy strategy (IMAGE)

Tsinghua University Press

Low dielectric loss in vanadium-based zircon ceramics via high-entropy strategy

Caption

This paper reports on the excellent microwave dielectric properties of (Nd0.2Eu0.2Y0.2Ho0.2Yb0.2)VO4 ceramics (εr = 11.55, Q×f = 76,400 GHz, τf = -37.3 ppm/°C). The Q×f value is more than twice that of most traditional zircon ceramics and represents the highest Q×f reported for zircon ceramics to date. This ceramic hold significant potential for application in high-performance, high-power microwave devices.

Credit

Journal of Advanced Ceramics, Tsinghua University Press

Usage Restrictions

Credit must be given to the creator.

License

CC BY

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.