X-ray Linear Dichroic Orientation Tomography allows the mapping of ordered material structures at the nanoscale, giving new insights into material functionality. (IMAGE)
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Many functional materials are composed of domains or grains, where molecules and atoms are arranged in a repeating pattern with a particular orientation. This structure is critical to material performance. The new technique, X-ray Linear Dichroic Orientation Tomography (XL-DOT), allows 3D mapping of such structure at the nanoscale. Here, the technique is applied to a pillar of vanadium pentoxide catalyst, used in the production of sulfuric acid. The colours in the tomogram represent the different orientation of grains. (Image: Paul Scherrer Institute / Andreas Apseros)
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Paul Scherrer Institute / Andreas Apseros
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