Working Principle of Extended Depth-of-Field Random Illumination Microscopy (EDF-RIM) (IMAGE)

Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS

Working Principle of Extended Depth-of-Field Random Illumination Microscopy (EDF-RIM)

Caption

Top: Random Illumination Microscopy (RIM) utilizes random speckle patterns to achieve super-resolution imaging of biological tissues, improving resolution by a factor of two compared to the optical diffraction limit.

Bottom: Traditional RIM and conventional optical microscopes require sequential acquisition of numerous slices to capture 3D volumes. In the innovative EDF-RIM approach, the extended depth-of-field detection allows simultaneous capture of all focal planes, significantly reducing acquisition time and minimizing light exposure.

Credit

Lorry Mazzella et al.

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Credit must be given to the creator.

License

CC BY

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