Transient imaging reveals direction-dependent light propagation through a scattering medium, in excellent agreement with simulations. The technique enables full characterization of structurally anisotropic materials (e.g., Teflon tape). (IMAGE)

SPIE--International Society for Optics and Photonics

Transient imaging reveals direction-dependent light propagation through a scattering medium, in excellent agreement with simulations. The technique enables full characterization of structurally anisotropic materials (e.g., Teflon tape).

Caption

Transient imaging reveals direction-dependent light propagation through a scattering medium, in excellent agreement with simulations. The technique enables full characterization of structurally anisotropic materials (e.g., Teflon tape). 

Credit

E. Pini et al., doi 10.1117/1.APN.3.5.056017.

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