Figure 1 | Phase measurement for metalens working at 1560nm. (IMAGE)

Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS

Figure 1 | Phase measurement for metalens working at 1560nm.

Caption

(a) and (b) Optical microscope images depicting the sample with defects and the defect-free sample. (c) and (d) Experimentally measured optical field distributions for the sample with defects and the defect-free sample. Phase distribution, wave aberration, and Zernike expansion coefficients are illustrated for the sample with defects in (e)-(g) and the defect-free sample in (h)-(j).

Credit

by Bowen Liu, Jialuo Cheng, Maoxiong Zhao, Jin Yao, Xiaoyuan Liu, Shaohu Chen, , Lei Shi, Din Ping Tsai, Zihan Geng, and Mu Ku Chen

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Credit must be given to the creator.

License

CC BY

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