For the first time X-ray scientists have combined high-resolution imaging with 3-D viewing of the surface layer of material using X-ray vision in a way that does not damage the sample.
This new technique expands the range of X-ray research possible for biology and many aspects of nanotechnology, particularly nanofilms, photonics, and micro- and nano-electronics. This new technique also reduces "guesswork" by eliminating the need for modeling-dependent structural simulation often used in X-ray analysis.